Advanced Physical Research

Advanced Physical Research

ISSN Print: 2663-8436
ISSN Online: 3105-3548

Advanced Physical Research is an open access Journal, publishing fully peer-reviewed original and review papers as well as brief reports on topics in all areas of theoretical and applied physics. The journal provides a platform for researchers who wish to summarize a field of physics research and share this work as widely as possible. The published papers provide an overview of the main developments on a particular topic, with an emphasis on recent developments, and sketch an outlook on future developments.

Share
Abstract

The new approach for electrochemical deposition of the magnetic/non-magnetic metal multilayered film structures was proposed. The joint complex electrolyte based on Ni2+; Fe2+ and Cu2+ salts was developed. This complex electrolyte that contains compounds for magnetic (NiFe alloy) and non-magnetic (Cu) layers can be successfully used for permalloy/copper multilayered structures preparation. NiFe alloy and Cu electrodeposition kinetics was studied and optimal potential and current ranges for NiFe and Cu were estimated. The possibility of synthesizing single-layer ferromagnetic NiFe films, single-layer diamagnetic Cu films, as well as multilayer NiFe/Cu/NiFe films from a single complex electrolyte has been demonstrated. In the potential range from -0.25 to -0.4 V, a copper films without nickel and iron impurities were deposited. The Ni/Fe ratio in the alloy increases from 2.51 to 4.76 as the potential decreases from -0.92 to -0.95 V. The extra low Cu impurity in NiFe films was achieved (down to 3.2 at.%). It opens broad perspectives for application this approach for preparation of the layered film structures from one joint technological cycle. The critically low concentration of the non-magnetic impurities in magnetic layers as well as sharp interface boundaries between layers are key parameters for practical application.



Copy
  • View 46
  • Downloads 11
  • Saveds 0
  • Citations (Crossref) 0

Journal Metrics